BSP135 L6327

BSP135 SIPMOS® Small-Signal-Transistor Product Summary Features • N-channel • Depletion mode VDS 600 V RDS(on),max 60 W IDSS,min 0.02 A • dv /dt rated • Available with V GS(th) indicator on reel • Pb-free lead plating; RoHS compliant PG-SOT223 • Qualified according to AEC Q101 Type Type BSP135 BSP135 BSP135 BSP135 Package Package PG-SOT223 PG-SOT223 PG-SOT223 PG-SOT223 Tape and Reel Information Tape and Reel Information L6327: 1000 pcs/reel L6327: 1000 pcs/reel L6906: 1000 pcs/reel sorted1000 in VGS(th) bands   1)   L6906: pcs/reel Marking Marking BSP135 BSP135 BSP135 BSP135 Packaging Packaging Non dry Non dry Non dry Non dry Maximum ratings, at T j=25 °C, unless otherwise specified Parameter Symbol Conditions Continuous drain current ID Value T A=25 °C 0.12 T A=70 °C 0.10 I D,pulse T A=25 °C 0.48 Reverse diode dv /dt dv /dt I D=0.12 A, V DS=20 V, di /dt =200 A/µs, T j,max=150 °C Gate source voltage V GS Pulsed drain current ±20 ESD Class (JESD22-A114-HBM) A kV/µs V 1A(>250V,2|I D|R DS(on)max, I D=0.1 A 0.08 0.16 - S V DS=3 V, I D=94 µA -1.2 - -1 V K -1.35 - -1.15 L -1.5 - -1.3 M -1.65 - -1.45 N -1.8 - -1.6 Transconductance g fs W Threshold voltage V GS(th) sorted in bands3) J V GS(th) 2) Device on 40 mm x 40 mm x 1.5 mm epoxy PCB FR4 with 6 cm 2 (single layer, 70 µm thick) copper area for drain connection. PCB is vertical in still air. 3) Each reel contains transistors out of one band whose identifying letter is printed on the reel label. A specific band cannot be ordered separately. Rev. 1.32 page 2 2012-03-20 BSP135 Parameter Values Symbol Conditions Unit min. typ. max. - 98 146 - 8.5 13 Dynamic characteristics Input capacitance C iss Output capacitance C oss Reverse transfer capacitance Crss - 3.4 5.1 Turn-on delay time t d(on) - 5.4 8.1 Rise time tr - 5.6 8.4 Turn-off delay time t d(off) - 28 42 Fall time tf - 182 273 Gate to source charge Q gs - 0.24 0.36 Gate to drain charge Q gd - 2.0 3.0 Gate charge total Qg - 3.7 4.9 Gate plateau voltage V plateau - 0.20 - V - - 0.12 A - - 0.48 - 0.78 1.2 V - 87 130 ns - 70 104 nC V GS=-3 V, V DS=25 V, f =1 MHz V DD=300 V, V GS=-3...5 V, I D=0.1 A, R G=6 W pF ns Gate Charge Characteristics V DD=400 V, I D=0.1 A, V GS=-3 to 5 V nC Reverse Diode Diode continous forward current IS Diode pulse current I S,pulse Diode forward voltage V SD Reverse recovery time t rr Reverse recovery charge Q rr Rev. 1.32 T A=25 °C V GS=-3 V, I F=0.12 A, T j=25 °C V R=300 V, I F=0.1 A, di F/dt =100 A/µs page 3 2012-03-20 BSP135 1 Power dissipation 2 Drain current P tot=f(T A) I D=f(T A); V GS≥10 V 2 0.15 1.5 ID [A] Ptot [W] 0.1 1 0.05 0.5 0 0 0 40 80 120 160 0 40 80 TA [°C] 120 160 TA [°C] 3 Safe operating area 4 Max. transient thermal impedance I D=f(V DS); T A=25 °C; D =0 Z thJA=f(t p) parameter: t p parameter: D =t p/T 100 102 10 µs limited by on-state resistance 100 µs 0.5 10-1 0.2 ZthJA [K/W] ID [A] 1 ms 10 ms 101 0.1 0.05 single pulse 10-2 0.02 DC 0.01 10-3 100 100 101 102 103 VDS [V] Rev. 1.32 10-4 10-3 10-2 10-1 100 101 102 tp [s] page 4 2012-03-20 BSP135 5 Typ. output characteristics 6 Typ. drain-source on resistance I D=f(V DS); T j=25 °C R DS(on)=f(I D); T j=25 °C parameter: V GS parameter: V GS 0.25 100 10 V -0.2 V 1V 0.2 V 0V -0.1 V 0.2 0.5 V 0.1 V 80 0.5 V RDS(on) [W] ID [A] 0.15 0.2 V 0.1 V 0.1 60 40 0V 1V -0.1 V -0.2 V 0.05 10 V 20 0 0 0 2 4 6 8 10 0 0.04 0.08 VDS [V] 0.12 0.16 0.2 ID [A] 7 Typ. transfer characteristics 8 Typ. forward transconductance I D=f(V GS); |V DS|>2|I D|R DS(on)max g fs=f(I D); T j=25 °C 0.25 0.2 0.2 0.15 ID [A] gfs [S] 0.15 0.1 0.1 0.05 0.05 0 -2 -1 0 1 VGS [V] Rev. 1.32 0 0.00 0.04 0.08 0.12 ID [A] page 5 2012-03-20 BSP135 9 Drain-source on-state resistance 10 Typ. gate threshold voltage R DS(on)=f(T j); I D=0.01 A; V GS=0 V V GS(th)=f(T j); V DS=3 V; I D=94 µA parameter: I D 160 0 140 -0.5 120 98 % -1 VGS(th) [V] RDS(on) [W] 100 80 98 % typ -1.5 60 -2 2% 40 typ -2.5 20 0 -3 -60 -20 20 60 100 140 180 -60 -20 20 Tj [°C] 60 100 140 180 Tj [°C] 11 Threshold voltage bands 12 Typ. capacitances I D=f(V GS); V DS=3 V; T j=25 °C C =f(V DS); V GS=-3 V; f =1 MHz 101 103 N M K L J Ciss 102 C [pF] ID [mA] 100 10-1 101 Coss 94 µA Crss 10-2 100 -2 -1.5 -1 -0.5 VGS [V] Rev. 1.32 0 10 20 30 VDS [V] page 6 2012-03-20 BSP135 13 Forward characteristics of reverse diode 15 Typ. gate charge I F=f(V SD) V GS=f(Q gate); I D=0.1 A pulsed parameter: T j parameter: V DD 100 8 0.5 VDS(max) 0.2 VDS(max) 6 0.8 VDS(max) 25 °C 10-1 150 °C 4 150 °C, 98% IF [A] VGS [V] 25 °C, 98% 2 0 10-2 -2 10-3 -4 0 0.5 1 1.5 2 VSD [V] 0 1 2 3 4 5 Qgate [nC] 16 Drain-source breakdown voltage V BR(DSS)=f(T j); I D=250 µA 700 VBR(DSS) [V] 660 620 580 540 500 -60 -20 20 60 100 140 180 Tj [°C] Rev. 1.32 page 7 2012-03-20 BSP135 Package Outline: Footprint: Packaging: Dimensions in mm Rev. 1.32 page 8 2012-03-20 BSP135 Published by Infineon Technologies AG 81726 Munich, Germany © 2008 Infineon Technologies AG All Rights Reserved. Legal Disclaimer The information given in this document shall in no event be regarded as a guarantee of conditions or characteristics. With respect to any examples or hints given herein, any typical values stated herein and/or any information regarding the application of the device, Infineon Technologies hereby disclaims any and all warranties and liabilities of any kind, including without limitation, warranties of non-infringement of intellectual property rights of any third party. Information For further information on technology, delivery terms and conditions and prices, please contact the nearest Infineon Technologies Office (www.infineon.com). Warnings Due to technical requirements, components may contain dangerous substances. For information on the types in question, please contact the nearest Infineon Technologies Office. Infineon Technologies components may be used in life-support devices or systems only with the express written approval of Infineon Technologies, if a failure of such components can reasonably be expected to cause the failure of that life-support device or system or to affect the safety or effectiveness of that device or system. Life support devices or systems are intended to be implanted in the human body or to support and/or maintain and sustain and/or protect human life. If they fail, it is reasonable to assume that the health of the user or other persons may be endangered. Rev. 1.32 page 9 2012-03-20